FEI Unveils New Solutions for Faster Time-To-Analysis in Metals Research
Aug 4 14
FEI announced two new products that speed up the imaging and analysis time for metals researchers and industrial failure analysis labs. The Helios™ PFIB DualBeam™, the first DualBeam within FEI’s product portfolio to include a plasma-based focused ion beam (PFIB), mills 20 - 50 times faster than gallium-based FIBs to deliver rapid, three-dimensional (3D) imaging and analysis. The Teneo™ scanning electron microscope (SEM) provides high-resolution, high-contrast images and fast, precise analytical results, enabling researchers to clearly resolve grain boundaries, interfaces and structure/topography of difficult-to-image magnetic and nonconductive samples. Current gallium-based FIBs have been used traditionally to prepare TEM samples, perform cross-sections and provide 3D analysis, but the scales are limited due to the time that the milling process requires, which can be many days for larger scales. The Helios PFIB DualBeam can do the same work in hours, increasing throughput and the size of features that can be studied. In addition to metals research, the delamination of paints and coatings and analysis of grain boundaries, thin films, interfaces and adhesion layers are potential application for the new Helios PFIB DualBeam. The Teneo SEM includes a unique, non-immersion objective lens that is specifically-designed to deliver high-resolution on magnetic materials. Together, this lens and FEI’s Trinity™ detection scheme deliver high image contrast from a wide variety of materials, especially magnetic materials, alloys and composites. Fast analytical capabilities, including energy dispersive spectrometry (EDS) and electron backscatter diffraction (EBSD), are supported by high-beam current and full 90-degree stage tilt. The highly-configurable platform includes optional low-vacuum capability for imaging of nonconductive samples, such as glass, ceramics and polymers. Multi-user laboratory environments will also benefit from the ease-of-use of the Teneo SEM, for example, most users, regardless of experience level, can leverage step-by-step workflows to get useful results more quickly.
FEI Company Reports Unaudited Consolidated Earnings Results for the Second Quarter and Six Months Ended June 29, 2014; Reports Impairment for the Second Quarter Ended June 29, 2014; Provides Earnings Guidance for the Third Quarter Ending September 28, 2014 and Revenue Guidance for the Full Year 2014
Jul 30 14
FEI Company reported unaudited consolidated earnings results for the second quarter and six months ended June 29, 2014. For the quarter, the company reported operating income of $30,815,000, income before taxes of $30,009,000, net income of $24,948,000 or $0.59 basic and diluted per share on total net sales of $236,955,000 against operating income of $38,450,000, income before taxes of $36,998,000, net income of $29,993,000 or $0.72 diluted per share on total net sales of $222,478,000 for the same period a year ago. Net cash provided by operating activities was $15,976,000 against $56,714,000 for the same period a year ago. Acquisition of property, plant and equipment was $18,986,000 against $37,522,000 for the same period a year ago. Non-GAAP operating income was $36,764,000 against $38,845,000 a year ago. Non-GAAP net income was $29,733,000 or $0.70 per diluted share against $30,310,000 or $0.72 per diluted share a year ago.
For the six months, the company reported operating income of $61,701,000, income before taxes of $60,625,000, net income of $50,026,000 or $1.17 diluted per share on total net sales of $463,220,000 against operating income of $71,973,000, income before taxes of $69,016,000, net income of $56,794,000 or $1.36 diluted per share on total net sales of $443,667,000 for the same period a year ago. Net cash provided by operating activities was $44,424,000 against $91,528,000 for the same period a year ago. Acquisition of property, plant and equipment was $23,322,000 against $42,566,000 for the same period a year ago. Non-GAAP operating income was $68,981,000 against $73,063,000 a year ago. Non-GAAP net income was $55,882,000 or $1.31 per diluted share against $57,668,000 or $1.38 per diluted share a year ago.
For the third quarter ending September 28, 2014, revenue is expected to be in the range of $228.0 million to $243.0 million. GAAP earnings per share are expected to be in the range of $0.35 to $0.45. GAAP earnings guidance for the third quarter includes restructuring and costs related to the move to the company's new leased facility in the Czech Republic of approximately $13.0 million to $13.6 million. Non-GAAP earnings per share are expected to be in the range of $0.60 to $0.70. The effective tax rate is expected to be approximately 19%. GAAP net income to be in the range of $15,000,000 to $19,000,000. Non-GAAP net income to be in the range of $25,530,000 to $30,016,000.
Revenue for the full year is now expected to be 5% to 7% greater than 2013.
For the second quarter ended June 30, 2014, the company reported impairment and other asset write-offs of $466,000.
FEI Adds Phase Plate Technology and Titan Halo Tem to its Structural Biology Product Portfolio
Jul 28 14
FEI announced two new products for cryo-electron microscopy applications: a new phase plate solution and the Titan Halo(TM) transmission electron microscope (TEM). The phase plate is a stable, durable solution to increase the contrast of sensitive biological samples and is available on most TEM platforms from FEI. The Titan Halo TEM provides high-quality optical performance with enhanced flexibility for multi-scale applications in life and biomaterials sciences. With these new products, researchers can now see more detail in their biological specimens, and potentially gain greater insight into the fundamental processes of living systems at the molecular scale. FEI's phase plate addresses the historical shortcomings of traditional TEM phase plate technology by delivering a stable, reliable, long-life contrast enhancement solution for structural biology applications. Its long life (at least four months) and stability permit extended experiments. The phase plate is incorporated into the TEM system hardware and software for greater ease of use and is a key component in delivering high-quality imaging to the FEI cryo-electron microscopy workflow. The Titan Halo is designed for optical excellence and versatility, and can be used for either life science or materials science research in both cryo and room temperature conditions. The Titan Halo supports many FEI accessories and components, such as direct electron detectors and correctors and dedicated application software, all of which are embedded into the system and can be operated from the software interface. This smooth workflow approach makes the system easy to use, enabling more-efficient experiments to be completed in less time.