July 24, 2014 9:21 AM ET

Electronic Equipment, Instruments and Components

Company Overview of Carl Zeiss X-ray Microscopy, Inc.

Company Overview

Carl Zeiss X-ray Microscopy, Inc. designs and manufactures 3D X-ray microscopes (XRM) for industrial and academic research applications. It offers UltraSPX and the UltraXRM-S 3D XRM for synchrotron facilities; VersaXRM-500, a 3D XRM solution for non-destructive micro tomography; UltraXRM-L200, an ultra-high resolution CT scanner for 3D visualization of microscopic sample volumes; and X-ray optics. The company’s products are used in semiconductor process optimization and failure analysis, life sciences, GEO materials, materials science, and multi-lengthscale imaging applications. Carl Zeiss X-ray Microscopy, Inc. was formerly known as Xradia, Inc. and changed its name to Carl Zeiss X-ray Micr...

4385 Hopyard Road

Suite 100

Pleasanton, CA 94588

United States

Founded in 1999

Phone:

925-701-3600

Fax:

925-730-4952

Key Executives for Carl Zeiss X-ray Microscopy, Inc.

Chief Executive Officer and Director
Age: 51
Founder
Vice President of Finance
Chief Materials Scientist and Vice President of Marketing
Vice President of Business Development
Compensation as of Fiscal Year 2014.

Carl Zeiss X-ray Microscopy, Inc. Key Developments

Xradia Extends X-ray Microscopy to Advance Pursuit of Discovery Previously Unachievable With Lab-Based Imaging

Xradia, Inc. is announcing a new X-ray microscope that gives scientists unprecedented flexibility for studying hard-to-image materials and their microstructures within industrial and scientific laboratory environments. The new VersaXRM-520 extends the boundaries of non-destructive 3D imaging with advanced contrast tuning capabilities, extensive filtering options, and enhancements delivering greater accuracy and workflow efficiency. VersaXRM-520 introduces: Dual-Scan Contrast Visualizer (DSCoVer) for Compositional Contrast: flexible side-by-side tuning of two distinct tomographies enables compositional probing for features often indistinguishable in a single scan. DSCoVer enables researchers to seamlessly and easily collect the data required for dual energy analysis. By enabling the efficient alignment of two datasets at different incident X-ray energies, the user is able to decouple some contrast mechanisms and freely explore contrast for features of interest within a sample. Automated Filter Changer: enabling select or application-specific filters to be changed within recipes without manual intervention for greater ease of use and workflow efficiencies. The AFC houses source filters used to tune the X-ray energy spectrum, with selection easily programmed and recorded for future use. The AFC ships with a standard set of twelve filters and features twelve additional slots to accommodate custom source filters such as those composed of different materials and thicknesses.

Xradia, Inc. Announces VersaXRM-410

Xradia, Inc. announced the expansion of its lab-based VersaXRM family to bridge the gap between high-performing 3D X-ray microscopy (XRM) solutions and traditionally lower-cost, less capable projection-based computed tomography (CT) systems. The VersaXRM-410 delivers the advantages of the VersaXRM family including high resolution and contrast and in situ capabilities that enable ground-breaking research for the widest range of sample sizes. VersaXRM: Extending the Boundaries of Science: The VersaXRM family with its unique architecture offers the only imaging solution that combines: Non-destructive 3D X-ray imaging, preserving and extending the use of valuable samples; High resolution: 0.9 um true spatial resolution on the VersaXRM-410 with minimum achievable voxel size of 100 nm; Advanced contrast: absorption contrast and unique phase contrast enable unparalleled imaging quality for soft materials such as unstained tissue or low-Z materials like carbon fibers and polymers, with the ability to differentiate between phases of similar density; 4D and in situ capabilities including for flexible sample sizes and types, enabled by the VersaXRM's Resolution at a Distance (RaaD).

Xradia, Inc. Announces New Scout-and-Scan Control Software for VersaXRM Instruments

Xradia, Inc. announced its new Scout-and-Scan(TM) Control Software for VersaXRM instruments. The new, easy-to-use control system is ideal in a multi-user setting where users have a wide variety of experience. The new control system maintains the flexibility for which the VersaXRM system is known, making set-up of scans even easier. The intuitive workflow environment enables users to easily scout their region of interest and select scanning parameters. The new software also offers recipe-based repeatability, which is especially useful for in situ and 4D research, and also enables greater control and efficiency for future work. Additionally, a window in the control panel always provides a clear view of the sample being imaged. The new control system was especially created for the multi-user environment, from the central imaging laboratories of academia hosting professors and senior researchers through students of various levels, or the semiconductor failure analysis lab that serves a wide range of experience factors.

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