Electronic Equipment, Instruments and Components
Company Overview of Carl Zeiss X-ray Microscopy, Inc.
Carl Zeiss X-ray Microscopy, Inc. designs and manufactures 3D X-ray microscopes (XRM) for industrial and academic research applications. It offers UltraSPX and the UltraXRM-S 3D XRM for synchrotron facilities; VersaXRM-500, a 3D XRM solution for non-destructive micro tomography; UltraXRM-L200, an ultra-high resolution CT scanner for 3D visualization of microscopic sample volumes; and X-ray optics. The company’s products are used in semiconductor process optimization and failure analysis, life sciences, GEO materials, materials science, and multi-lengthscale imaging applications. Carl Zeiss X-ray Microscopy, Inc. was formerly known as Xradia, Inc. and changed its name to Carl Zeiss X-ray Micr...
4385 Hopyard Road
Pleasanton, CA 94588
Founded in 1999
Key Executives for Carl Zeiss X-ray Microscopy, Inc.
Chief Executive Officer and Director
Vice President of Finance
Chief Materials Scientist and Vice President of Marketing
Vice President of Business Development
Compensation as of Fiscal Year 2014.
Carl Zeiss X-ray Microscopy, Inc. Key Developments
Xradia Extends X-ray Microscopy to Advance Pursuit of Discovery Previously Unachievable With Lab-Based Imaging
Jun 4 13
Xradia, Inc. is announcing a new X-ray microscope that gives scientists unprecedented flexibility for studying hard-to-image materials and their microstructures within industrial and scientific laboratory environments. The new VersaXRM-520 extends the boundaries of non-destructive 3D imaging with advanced contrast tuning capabilities, extensive filtering options, and enhancements delivering greater accuracy and workflow efficiency. VersaXRM-520 introduces: Dual-Scan Contrast Visualizer (DSCoVer) for Compositional Contrast: flexible side-by-side tuning of two distinct tomographies enables compositional probing for features often indistinguishable in a single scan. DSCoVer enables researchers to seamlessly and easily collect the data required for dual energy analysis. By enabling the efficient alignment of two datasets at different incident X-ray energies, the user is able to decouple some contrast mechanisms and freely explore contrast for features of interest within a sample. Automated Filter Changer: enabling select or application-specific filters to be changed within recipes without manual intervention for greater ease of use and workflow efficiencies. The AFC houses source filters used to tune the X-ray energy spectrum, with selection easily programmed and recorded for future use. The AFC ships with a standard set of twelve filters and features twelve additional slots to accommodate custom source filters such as those composed of different materials and thicknesses.
Xradia, Inc. Announces VersaXRM-410
Apr 2 13
Xradia, Inc. announced the expansion of its lab-based VersaXRM family to bridge the gap between high-performing 3D X-ray microscopy (XRM) solutions and traditionally lower-cost, less capable projection-based computed tomography (CT) systems. The VersaXRM-410 delivers the advantages of the VersaXRM family including high resolution and contrast and in situ capabilities that enable ground-breaking research for the widest range of sample sizes. VersaXRM: Extending the Boundaries of Science: The VersaXRM family with its unique architecture offers the only imaging solution that combines: Non-destructive 3D X-ray imaging, preserving and extending the use of valuable samples; High resolution: 0.9 um true spatial resolution on the VersaXRM-410 with minimum achievable voxel size of 100 nm; Advanced contrast: absorption contrast and unique phase contrast enable unparalleled imaging quality for soft materials such as unstained tissue or low-Z materials like carbon fibers and polymers, with the ability to differentiate between phases of similar density; 4D and in situ capabilities including for flexible sample sizes and types, enabled by the VersaXRM's Resolution at a Distance (RaaD).
Xradia, Inc. Announces New Scout-and-Scan Control Software for VersaXRM Instruments
Nov 27 12
Xradia, Inc. announced its new Scout-and-Scan(TM) Control Software for VersaXRM instruments. The new, easy-to-use control system is ideal in a multi-user setting where users have a wide variety of experience. The new control system maintains the flexibility for which the VersaXRM system is known, making set-up of scans even easier. The intuitive workflow environment enables users to easily scout their region of interest and select scanning parameters. The new software also offers recipe-based repeatability, which is especially useful for in situ and 4D research, and also enables greater control and efficiency for future work. Additionally, a window in the control panel always provides a clear view of the sample being imaged. The new control system was especially created for the multi-user environment, from the central imaging laboratories of academia hosting professors and senior researchers through students of various levels, or the semiconductor failure analysis lab that serves a wide range of experience factors.
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