Verigy Ltd., together with its subsidiaries, designs, develops, manufactures, and sells test systems and solutions for the semiconductor industry primarily in North America, Europe, and Asia. It provides scalable platforms, including V93000 series platform to test system-on-a-chip, system-in-a-package, and high-speed memory devices; V6000 series platform to test both flash memory and dynamic random access memory devices, and V101 platform to test cost-sensitive devices and consumer mixed-signal devices. The company also designs, manufactures, and sells micro electro-mechanical system based probe cards used in wafer-sort testing of memory devices. In addition, it offers consulting, and servic...
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ISE Labs Installs Verigy's V93000 Test Platforms at Facilities in Silicon Valley and Austin, Texas
Feb 29 12
Verigy, Ltd. announced that ISE Labs has installed V93000 Smart Scale(TM) and Pin Scale Generation testers with Pin Scale digital channel cards at its testing and packaging facilities in Fremont, California, and Austin, Texas, extending the test-development services partnership between the two companies. As the latest step in a long-standing strategic alliance, ISE Labs' Austin facility will begin using Verigy's Pin Scale technology to develop advanced test methodologies for the latest generation of low-power ARM-based server processors with high-speed DDR3 memories, PCI Express interfaces and consumer ICs such as smart media system-on-chip (SOC) devices for next-generation media gateways and set-top boxes. To meet these objectives, ISE Labs has installed in Austin a V93000 Pin Scale Generation system with an L-Class test head, delivering more than 900 pins, based on Verigy's Pin Scale 400 and Pin Scale 800 cards. In addition, ISE Labs' Fremont facility -- Silicon Valley's largest semiconductor testing laboratory -- has installed two V93000 Smart Scale Generation testers with Pin Scale 1600 cards for use in production-volume testing of customers' ICs. One of these systems has a C-Class test head with over 1,000 pins using Pin Scale 1600 and Pin Scale 9G cards and the other unit is equipped with Verigy's smallest A-Class test head, populated with 512 pins, and a MB-AV8 PLUS analog card. The systems also are upgradeable to provide increased pin counts or to add new measurement resources such as Verigy's Port Scale RF solution. These installations mark the first application of the company's Smart Scale technology by a test-services provider in Silicon Valley. The Pin Scale 1600 card opens a new dimension in test flexibility. With this card's universal per-pin architecture, each channel is able to perform any function needed by the device under test, providing maximum flexibility. Per-pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. Verigy's Pin Scale 9G card is the only fully integrated, high-speed, digital instrument covering the entire range from DC to more than 8 gigabits per second, making at-speed test affordable. The highly versatile Pin Scale 9G can test any combination of parallel or serial, single-ended or differential, and uni- or bi-directional interfaces. The MB-AV8 PLUS analog card expands real-time analog bandwidth to cover emerging applications such as LTE Advanced for 4G wireless communications. It provides high throughput while maintaining compatibility with established MB-AV8 instruments.