Last $2.65 USD
Change Today +0.29 / 12.29%
Volume 46.8K
AEHR On Other Exchanges
As of 8:10 PM 11/26/14 All times are local (Market data is delayed by at least 15 minutes).

aehr test systems (AEHR) Snapshot

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12/10/13 - $3.48
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aehr test systems (AEHR) Details

Aehr Test Systems designs, engineers, develops, manufactures, and sells test and burn-in equipment used in the semiconductor industry worldwide. Its systems are used to simultaneously perform parallel testing and burn-in of packaged integrated circuits (ICs), singulated bare die, or ICs still in wafer form. The company offers Advanced Burn-In and Test System that tests and burn-in high-power logic and low-power ICs; FOX full wafer contact parallel test and burn-in systems designed to make contact with all pads of a wafer simultaneously, thus enabling full wafer parallel test and burn-in; and MAX burn-in system designed for monitored burn-in of memory and logic devices. It products also comprise WaferPak full wafer contactor, a cartridge system that includes a full-wafer probe card for use in testing wafers in FOX systems; DiePak carrier, a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of singulated bare die; and test fixtures that hold the devices undergoing test or burn-in and electrically connect the devices under test to the system electronics. In addition, the company offers customer service and support programs, including system installation, system repair, applications engineering support, spare parts inventories, customer training, and documentation. It markets and sells its products to semiconductor manufacturers, semiconductor contract assemblers, electronics manufacturers, and burn-in and test service companies through a network of distributors and sales representatives. The company was founded in 1977 and is headquartered in Fremont, California.

76 Employees
Last Reported Date: 08/28/14
Founded in 1977

aehr test systems (AEHR) Top Compensated Officers

Chief Executive Officer, President and Direct...
Total Annual Compensation: $235.1K
Chief Financial Officer, Principal Accounting...
Total Annual Compensation: $180.5K
President of Aehr Test Systems Japan K.K.
Total Annual Compensation: $167.4K
Vice President of Engineering
Total Annual Compensation: $231.0K
Vice President of Worldwide Sales
Total Annual Compensation: $202.6K
Compensation as of Fiscal Year 2014.

aehr test systems (AEHR) Key Developments

Aehr Test Systems Enters into Second Amendment to Certain Multi-Tenant Office Triple Net Lease

On November 7, 2014, Aehr Test Systems entered into a second amendment to that certain multi-tenant office triple net lease dated August 3, 1999, with CWCA Scott Creek 28, L.L.C. The amendment extends the term of the Lease for a period of thirty-six (36) calendar months, commencing on July 1, 2015 and expiring on June 30, 2018 with an option for the company to further extend the lease for an additional thirty-six (36) month period after the expiration date. Total base rent expense from the extension date through the expiration date is approximately $1.4 million.

Aehr Test Systems Receives Follow-On Order for ABTS Test System from Leading IC Manufacturer

Aehr Test Systems announced that it has received a follow-on order for an ABTS test and burn-in system from a leading multi-national manufacturer of advanced logic integrated circuits (ICs) for automotive, embedded processing, digital signal processing and analog applications. The order includes a down payment and volume pricing discount. This system is planned to ship in the second quarter of Aehr Test's fiscal 2015.

Aehr Test Systems to Introduce Next Generation FOX-1P(TM) Test System at 2014 International Test Conference in Seattle October 21-23

Aehr Test Systems announced that it is introducing the FOX-1P system, its next generation single wafer test system for high volume production and early failure rate (EFR) test, at the 2014 International Test Conference (ITC) taking place October 21-23 in Seattle, Washington at the Washington State Convention Center (Booth #515). The FOX-1P system can be configured with over 16,000 "Universal Channels" and features a massively parallel test interface, which enables testing over a thousand die in a single touchdown. The FOX-1P system is Aehr Test's second generation of the FOX-1 platform introduced in 2006. With up to 12,000 device power supplies (DPS), 3,500 signal channels (I/O), and electronics optimized for BIST/DFT testing, the FOX-1 system has proven to be a cost saving production solution for single touchdown 300mm full-wafer parallel test.


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