Last 3,771
Change Today -112.00 / -2.88%
Volume 20.4K
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As of 9:30 AM 07/24/14 All times are local (Market data is delayed by at least 15 minutes).

nova measuring instruments (NVMI) Snapshot

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02/18/14 - $4,255
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nova measuring instruments (NVMI) Details

Nova Measuring Instruments Ltd. designs, develops, produces, and sells integrated process control metrology systems and stand-alone metrology solutions used in the manufacturing process of semiconductors. Its metrology systems measure various thin film properties and critical circuit dimensions during various steps in the semiconductor manufacturing process. The company provides metrology systems for thin film measurement that is used in chemical mechanical polishing and chemical vapor deposition applications; optical top and bottom diameter, and metal line thickness systems for use in post-copper chemical mechanical polishing applications; and optical critical dimension systems for lithography and etches applications. It also offers integrated thickness monitoring systems for chemical mechanical polishing process control that enables wafer-to-wafer closed loop control. The company serves various sectors of the integrated circuit manufacturing industry, including logic, ASIC, foundries, and memory manufactures, as well as process equipment manufacturers worldwide. The company was founded in 1993 and is headquartered in Rehovot, Israel.

383 Employees
Last Reported Date: 02/28/14
Founded in 1993

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nova measuring instruments (NVMI) Key Developments

Nova Measuring Instruments Elects Zehava Simon as External Director

Nova Measuring Instruments announced that Zehava Simon was elected as the company's external Director at the recent annual general meeting of shareholders. Ms. Simon served as a Vice President of BMC Software Inc. from 2000 until 2013, and most recently there, she was Vice President of Corporate Development. Ms. Simon is currently a board member of AudioCodes Ltd. and of Amiad Filtration Systems.

Nova Measuring Instruments Receives Order for Through-Silicon-Via Metrology Solution

Nova Measuring Instruments announced that a major customer in Asia placed an order for its Through-Silicon-Via (TSV) metrology solution. This is the order from this customer for Nova's TSV stand-alone metrology solution. Following an intensive evaluation in a production environment, Nova's V2600(TM) solution was qualified to be the production tool of record (PTOR) for measuring and controlling the TSV formation process in both memory and logic applications. The company's V2600(TM) was selected over alternative solutions primarily due to its capabilities to accurately measure all critical TSV dimensions, including side-wall angle, bottom diameter, and bottom curvature. The company's patented technology combines an optical method, Dark-Field Reflectometry, which is sensitive to variations in TSV internal structures, with a novel modeling engine for non-periodic structures. The system was confirmed to enable tight and reliable process control at high sampling rates, minimizing potential yield loss due to TSV electrical failures.

Nova Measuring Instruments Ltd. Presents at D.A.Davidson & Co. 6th Annual Technology Forum, May-28-2014

Nova Measuring Instruments Ltd. Presents at D.A.Davidson & Co. 6th Annual Technology Forum, May-28-2014 . Venue: The Grand Hyatt New York, Park Avenue at Grand Central, New York, NY 10017, United States. Speakers: Eitan Oppenhaim, Chief Executive Officer and President.


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